Formal approach to security metrics. What does ‘more secure’ mean for you?

Publication Type:

Conference Proceedings

Authors:

Leanid Krautsevich; Fabio Martinelli; Artsiom Yautsiukhin

Source:

IEEE/ASME International Conference on Mechatronic and Embedded Systems and Applications, p.162–169 (2010)
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Last updated: Friday, 08 June 2018